Parallel Identity Testing for Skew Circuits with Big Powers and Applications

Powerful skew arithmetic circuits are introduced. These are skew arithmetic circuits with variables, where input gates can be labelled with powers xn for binary encoded numbers n. It is shown that polynomial identity testing for powerful skew arithmetic circuits belongs to coRNC, which generalizes a corresponding result for (standard) skew circuits. Two applications of this result are presented: (i) Equivalence of higher-dimensional straight-line programs can be tested in coRNC; this result is even new in the one-dimensional case, where the straight-line programs produce strings. (ii) The compressed word problem (or circuit evaluation problem) for certain wreath products of finitely generated abelian groups belongs to coRNC.